GENEVA, April 28 -- X-SIGHT S.R.O. (Stankova 557/18a60200 Brno) filed a patent application (PCT/CZ2024/050039) for "METHOD OF MEASURING DEFORMATIONS BY MEANS OF OPTICAL EXTENSOMETER" on Jun 03, 2024. With publication no. WO/2025/082557, the details related to the patent application was published on Apr 24, 2025.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
Inventor(s): VAJDAK, Michal (Drevarska 870/3160200 Brno), GAJDOS, Petr (Nadrazni 1260/766434 Kurim), CEPELA, Jan (Halova 60276001 Zlin)
Abstract:
A method of measuring deformation of a sample (1 ) by an optical extensometer comprising two cameras (3) f...