INTERNATIONAL PATENT: WUHAN INSTITUTE OF TECHNOLOGY, 武汉工程大学 FILES APPLICATION FOR "DEFECT DETECTION METHOD AND APPARATUS BASED ON NONLINEAR SYSTEM IDENTIFICATION"

GENEVA, Oct. 26 -- WUHAN INSTITUTE OF TECHNOLOGY (No. 206 Guanggu 1st Road, Donghu New Technology Development Zone, Jiangxia DistrictWuhan, Hubei 430000), 武汉工程大学 (中国湖北省武汉市江夏区东湖新技术开发区光谷一路206号) filed a patent application (PCT/CN2025/087694) for "DEFECT DETECTION METHOD AND APPARATUS BASED ON NONLINEAR SYSTEM IDENTIFICATION" on Apr 08, 2025. With publication no. WO/2025/218525, the details related to the patent application was published on Oct 23, 2025.

Notably, the patent application was submitted under the International Patent Classif...