INTERNATIONAL PATENT: VISIE, INC. FILES APPLICATION FOR "SYSTEM AND RELATED METHODS FOR THE CHARACTERIZATION OF OBJECTS THROUGH SUBSURFACE SCATTERING ACROSS ONE OR MORE EDGES OF LUMINOSITY"

GENEVA, Oct. 20 -- VISIE, INC. (3913 Medical ParkwaySuite 200Austin, TX 78756) filed a patent application (PCT/US2025/024625) for "SYSTEM AND RELATED METHODS FOR THE CHARACTERIZATION OF OBJECTS THROUGH SUBSURFACE SCATTERING ACROSS ONE OR MORE EDGES OF LUMINOSITY" on Apr 14, 2025. With publication no. WO/2025/217654, the details related to the patent application was published on Oct 16, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): BERNSTEIN, Aaron (9505 Tea Rose TrailAustin, TX 78748), FISHER, Andrew (3913 Medical ParkwaySuite 200Austin, TX 78756), SCHEUFELE, Klaudius (805 Azie Morton Rd. ...