GENEVA, Feb. 18 -- VETTED SECURITY SOLUTIONS LLC (4185 35th St. NSt. Petersburg, FL 33714), BARNETT, Ryan (4185 35th St. NSt. Petersburg, FL 33714), NICKELSON, Peter (4185 35th St. NSt. Petersburg, FL 33714), MOTWANI, Kunal (4185 35th St. NSt. Petersburg, FL 33714) filed a patent application (PCT/US2024/040886) for "CROWD DENSITY MONITORING SYSTEMS AND METHODS" on Aug 03, 2024. With publication no. WO/2025/034620, the details related to the patent application was published on Feb 13, 2025.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
Inventor(s): VETTED SECURITY SOLUTIONS LLC (4185 35th St. NSt. Petersburg,...