INTERNATIONAL PATENT: VANDERBILT UNIVERSITY FILES APPLICATION FOR "MACHINE LEARNING-BASED SYSTEMS AND METHODS FOR TWO-DIMENSIONAL MEASUREMENTS IN MAGNETIC RESONANCE IMAGING (MRI) IMAGES"

GENEVA, Jan. 20 -- VANDERBILT UNIVERSITY (305 Kirkland Hall2201 West End AvenueNashville, Tennessee 37240) filed a patent application (PCT/US2025/037578) for "MACHINE LEARNING-BASED SYSTEMS AND METHODS FOR TWO-DIMENSIONAL MEASUREMENTS IN MAGNETIC RESONANCE IMAGING (MRI) IMAGES" on Jul 14, 2025. With publication no. WO/2026/015898, the details related to the patent application was published on Jan 15, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): DENDY, Jeffrey (c/o Vanderbilt University305 Kirkland Hall2201 West End AvenueNashville, Tennessee 37240)

Abstract: A system may receive an MRI i...