INTERNATIONAL PATENT: UNIVERSITY OF DELAWARE FILES APPLICATION FOR "PATTERNED PROBE STRUCTURES, METHODS FOR FABRICATION AND MICRO-MECHANICAL SPRING SYSTEMS CONTAINING THE SAME"

GENEVA, May 28 -- UNIVERSITY OF DELAWARE (591 Collaboration Way, 2nd FloorNewark, Pennsylvania 19713) filed a patent application (PCT/US2024/056056) for "PATTERNED PROBE STRUCTURES, METHODS FOR FABRICATION, AND MICRO-MECHANICAL SPRING SYSTEMS CONTAINING THE SAME" on Nov 15, 2024. With publication no. WO/2025/106767, the details related to the patent application was published on May 22, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): HERRMANN, Eric (c/o University of Delaware591 Collaboration Way, 2nd FloorNewark, Delaware 19713), WANG, Xi (c/o University of Delaware591 Collaboration Way, 2nd...