INTERNATIONAL PATENT: UNIVERSITEIT ANTWERPEN FILES APPLICATION FOR "METHOD AND SYSTEM FOR COLLECTION OF ELECTRON DIFFRACTION DATA FROM A PARTICLE REGION"

GENEVA, June 30 -- UNIVERSITEIT ANTWERPEN (Prinsstraat 132000 Antwerpen) filed a patent application (PCT/EP2024/080837) for "METHOD AND SYSTEM FOR COLLECTION OF ELECTRON DIFFRACTION DATA FROM A PARTICLE REGION" on Oct 31, 2024. With publication no. WO/2025/131391, the details related to the patent application was published on Jun 26, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): VERBEECK, Johan (c/o Universiteit Antwerpen, RIVA, IP Dienst, Middelheimlaan 12020 Antwerpen), DENISOV, Nikita (c/o Universiteit Antwerpen, RIVA, IP Dienst, Middelheimlaan 12020 Antwerpen), OREKHOV, Andrey (c/o Uni...