INTERNATIONAL PATENT: UNIVERSITAT DE VALÈNCIA (ESTUDI GENERAL) FILES APPLICATION FOR "DEVICE AND METHOD FOR DETERMINING ABERRATIONS OR MEASURING OPTICAL CHARACTERISTICS"

GENEVA, Aug. 18 -- UNIVERSITAT DE VALÈNCIA (ESTUDI GENERAL) (Avda. Blasco Ibañez, 1346010 Valencia Valencia) filed a patent application (PCT/ES2025/070063) for "DEVICE AND METHOD FOR DETERMINING ABERRATIONS OR MEASURING OPTICAL CHARACTERISTICS" on Feb 07, 2025. With publication no. WO/2025/168872, the details related to the patent application was published on Aug 14, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): MICO SERRANO, Vicente (Avda. Blasco Ibañez, 1346010 Valencia Valencia), FERRER ALTABAS, Sara (Avda. Blasco Ibañez, 1346010 Valencia Valencia), SAUTER, Daniel (A...