INTERNATIONAL PATENT: UNIVERSITAT BERN FILES APPLICATION FOR "METHOD AND SYSTEM FOR MEASURING AT LEAST ONE SPATIAL, TEMPORAL OR SPATIOTEMPORAL GAIT PARAMETER"

GENEVA, Dec. 29 -- UNIVERSITAT BERN (VERWALTUNGSDIREKTIONHochschulstrasse 63012 Bern) filed a patent application (PCT/EP2025/067266) for "METHOD AND SYSTEM FOR MEASURING AT LEAST ONE SPATIAL, TEMPORAL OR SPATIOTEMPORAL GAIT PARAMETER" on Jun 19, 2025. With publication no. WO/2025/262220, the details related to the patent application was published on Dec 26, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): SINGLE, Michael (Thorigenstrasse 393360 Herzogenbuchsee), BRUHIN, Lena (Olivenweg 483008 Bern), KRUMMENACHER, Nic (Gassliweg 18955 Oetwil a.d.L), NEF, Tobias (Hubelstrasse 233930 Visp), BARC...