INTERNATIONAL PATENT: UNITY SEMICONDUCTOR FILES APPLICATION FOR "A DEVICE AND A METHOD FOR DETECTING CRYSTALLINE DEFECTS IN A SUBSTRATE BY DARK FIELD"

GENEVA, June 30 -- UNITY SEMICONDUCTOR (611 rue Aristide Berges38330 MONTBONNOT-SAINT-MARTIN) filed a patent application (PCT/EP2024/083213) for "A DEVICE AND A METHOD FOR DETECTING CRYSTALLINE DEFECTS IN A SUBSTRATE BY DARK FIELD" on Nov 22, 2024. With publication no. WO/2025/131535, the details related to the patent application was published on Jun 26, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): VERGNET, Hadrien (15 rue Antoine Polotti38400 SAINT-MARTIN D'HERES)

Abstract: The invention relates to a device (100) for detecting crystalline defects in an off-axis monocrystalline substra...