INTERNATIONAL PATENT: UNITEST INC, 주식회사 유니테스트 FILES APPLICATION FOR "CARTRIDGE MODULE AND MULTI-WAFER TEST APPARATUS USING SAME"

GENEVA, Aug. 19 -- UNITEST INC (27, Gigok-roGiheung-gu Yongin-siGyeonggi-do 17099), 주식회사 유니테스트 (경기도용인시 기흥구기곡로 27) filed a patent application (PCT/KR2024/007807) for "CARTRIDGE MODULE AND MULTI-WAFER TEST APPARATUS USING SAME" on Jun 07, 2024. With publication no. WO/2025/170110, the details related to the patent application was published on Aug 14, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): KIM, Dae Kyoung (B-dong 202-ho19-6 Singu-ro 22beon-g...