GENEVA, July 3 -- TRUSTEES OF TUFTS COLLEGE (Ballou HallMedford, MA 02155) filed a patent application (PCT/US2024/061248) for "METHOD AND DEVICE FOR IMAGE INSPECTION" on Dec 20, 2024. With publication no. WO/2025/137426, the details related to the patent application was published on Jun 26, 2025.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
Inventor(s): SOKOLOV, Igor (29 Winford WayMedford, MA 02155), PETROV, Mikhail (30 Ocean StreetLynn, MA 01902)
Abstract:
An optical-inspection system for inspecting a sample includes a microscope that receives light that has interacted with the sample to form an image,...