INTERNATIONAL PATENT: TRUMPF WERKZEUGMASCHINEN SE + CO. KG FILES APPLICATION FOR "MONITORING DEVICE, MONITORING ARRANGEMENT AND MONITORING METHOD FOR DETERMINING PROCESSING PARAMETERS OF A PROCESSING LASER BEAM"

GENEVA, Oct. 4 -- TRUMPF WERKZEUGMASCHINEN SE + CO. KG (Johann-Maus-Strasse 271254 Ditzingen) filed a patent application (PCT/EP2025/057971) for "MONITORING DEVICE, MONITORING ARRANGEMENT AND MONITORING METHOD FOR DETERMINING PROCESSING PARAMETERS OF A PROCESSING LASER BEAM" on Mar 24, 2025. With publication no. WO/2025/202116, the details related to the patent application was published on Oct 02, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): SCHMID, Alexander (FrankenstraBe 1697828 Marktheidenfeld), VOGL, Marco (ElbestraBe 2270376 Stuttgart), SCHINDHELM, David (Schaiblestr. 170499 Stuttga...