INTERNATIONAL PATENT: TRUMPF LASERSYSTEMS FOR SEMICONDUCTOR MANUFACTURING GMBH FILES APPLICATION FOR "METHOD AND MEASURING SYSTEM FOR DETERMINING THE EFFECTIVE FOCAL LENGTH OF AN OPTICAL SYSTEM"

GENEVA, Feb. 16 -- TRUMPF LASERSYSTEMS FOR SEMICONDUCTOR MANUFACTURING GMBH (Johann-Maus-StraBe 271254 Ditzingen) filed a patent application (PCT/EP2024/070155) for "METHOD AND MEASURING SYSTEM FOR DETERMINING THE EFFECTIVE FOCAL LENGTH OF AN OPTICAL SYSTEM" on Jul 16, 2024. With publication no. WO/2025/031738, the details related to the patent application was published on Feb 13, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): PIEHLER, Stefan (Ritterspornweg 170569 Stuttgart), ERGIN, Tolga (Obere Bruhlstr. 1074321 Bietigheim-Bissingen)

Abstract: The invention relates to a method and to a...