INTERNATIONAL PATENT: TRUMPF LASER SE FILES APPLICATION FOR "METHOD AND DEVICE FOR MONITORING AND CONTROLLING LASER MACHINING PROCESSES"

GENEVA, May 12 -- TRUMPF LASER SE (Aichhalder Strasse 3978713 Schramberg) filed a patent application (PCT/EP2024/080455) for "METHOD AND DEVICE FOR MONITORING AND CONTROLLING LASER MACHINING PROCESSES" on Oct 28, 2024. With publication no. WO/2025/093494, the details related to the patent application was published on May 08, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): JAHN, Andreas (MorikestraBe 2172175 Dornhan), THIERINGER, Rainer (Merowingerstr. 678662 Bosingen), ZIEGLER, Julia (VogtstraBe 278628 Rottweil)

Abstract: The invention relates to a method and a device for monitoring and c...