INTERNATIONAL PATENT: TRUMPF LASER- UND SYSTEMTECHNIK SE FILES APPLICATION FOR "REFERENCE APERTURE FOR REFLECTING SCATTERED RADIATION AND METHOD FOR ADJUSTING A LASER BEAM"

GENEVA, Sept. 8 -- TRUMPF LASER- UND SYSTEMTECHNIK SE (Johann-Maus-Strasse 271254 Ditzingen) filed a patent application (PCT/EP2025/053986) for "REFERENCE APERTURE FOR REFLECTING SCATTERED RADIATION AND METHOD FOR ADJUSTING A LASER BEAM" on Feb 14, 2025. With publication no. WO/2025/180861, the details related to the patent application was published on Sep 04, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): DORR, Stefan (Stresemannstr. 874321 Bietigheim-Bissingen), SAILER, Christof (An der Lehmgrube 1771254 Ditzingen)

Abstract: The invention relates to a reference aperture (8) for reflect...