GENEVA, Jan. 5 -- TRUMPF ADDITIVE MANUFACTURING ITALIA S.R.L. (Via Piemonte, 436015 Schio VI) filed a patent application (PCT/EP2025/067116) for "METHOD FOR MEASURING AT LEAST ONE SYSTEM PARAMETER IN A MANUFACTURING DEVICE, METHOD FOR ADDITIVELY MANUFACTURING OBJECTS FROM A POWDER MATERIAL, COMPUTER PROGRAM, CONTROL DEVICE AND MANUFACTURING DEVICE" on Jun 18, 2025. With publication no. WO/2026/002759, the details related to the patent application was published on Jan 02, 2026.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
Inventor(s): MICHIELI, Niccolò (Via Btg. Val Leogra 9536015 Schio), MANTOAN, Elia ...