INTERNATIONAL PATENT: TRACK3D GMBH FILES APPLICATION FOR "METHOD FOR ANALYZING AND MONITORING PROCESS PARAMETERS AND COMPONENT DATA DURING AN ADDITIVE MANUFACTURING PROCESS"

GENEVA, April 6 -- TRACK3D GMBH (Kamminer StraBe 210589 Berlin) filed a patent application (PCT/EP2024/077384) for "METHOD FOR ANALYZING AND MONITORING PROCESS PARAMETERS AND COMPONENT DATA DURING AN ADDITIVE MANUFACTURING PROCESS" on Sep 27, 2024. With publication no. WO/2025/068579, the details related to the patent application was published on Apr 03, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): HABEDANK, Jakob (Giselastr. 3510317 Berlin)

Abstract: The invention relates to a method for analyzing and/or monitoring process parameters and/or component data during an additive manufactur...