INTERNATIONAL PATENT: TOTALENERGIES ONETECH FILES APPLICATION FOR "A METHOD FOR DETERMINING INHERENT FEATURE(S) OF A GEOLOGICAL FORMATION AND RELATED COMPUTER PROGRAM PRODUCT"

GENEVA, Sept. 29 -- TOTALENERGIES ONETECH (La Defense 6 2 Place Jean Millier92400 Courbevoie) filed a patent application (PCT/IB2024/000133) for "A METHOD FOR DETERMINING INHERENT FEATURE(S) OF A GEOLOGICAL FORMATION AND RELATED COMPUTER PROGRAM PRODUCT" on Mar 21, 2024. With publication no. WO/2025/196465, the details related to the patent application was published on Sep 25, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): DEHGHAN, Kaveh (c/o TOTALENERGIES ONE TECH CSTJF Avenue Larribau64018 Pau Cedex), KOVALENKO, Olesia (c/o TOTALENERGIES ONE TECH CSTJF Avenue Larribau64018 Pau Cedex)

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