INTERNATIONAL PATENT: TOPCON CORPORATION, 株式会社トプコン FILES APPLICATION FOR "SURVEYING SYSTEM, SURVEYING METHOD AND SURVEYING PROGRAM"

GENEVA, March 25 -- TOPCON CORPORATION (75-1, Hasunuma-cho Itabashi-ku, Tokyo1748580), 株式会社トプコン (東京都板橋区蓮沼町７５番１号) filed a patent application (PCT/JP2024/031267) for "SURVEYING SYSTEM, SURVEYING METHOD, AND SURVEYING PROGRAM" on Aug 30, 2024. With publication no. WO/2025/057788, the details related to the patent application was published on Mar 20, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): NISHITA Nobuyuki (c/o TOPCON CORPORATION 75-1, ...