INTERNATIONAL PATENT: TOKYO SEIMITSU CO., LTD., 株式会社東京精密 FILES APPLICATION FOR "MEASUREMENT DEVICE, MEASUREMENT METHOD AND MEASUREMENT CONTROL PROGRAM"

GENEVA, Jan. 13 -- TOKYO SEIMITSU CO., LTD. (2968-2, Ishikawa-machi, Hachioji-shi, Tokyo1928515), 株式会社東京精密 (東京都八王子市石川町２９６８－２) filed a patent application (PCT/JP2025/022847) for "MEASUREMENT DEVICE, MEASUREMENT METHOD, AND MEASUREMENT CONTROL PROGRAM" on Jun 25, 2025. With publication no. WO/2026/009786, the details related to the patent application was published on Jan 08, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): HONMA ...