INTERNATIONAL PATENT: TOKYO ELECTRON LIMITED, 東京エレクトロン株式会社 FILES APPLICATION FOR "SUBSTRATE PROCESSING DEVICE, ABNORMALITY DETECTION METHOD AND METHOD FOR ADJUSTING SUBSTRATE PROCESSING DEVICE"

GENEVA, May 12 -- TOKYO ELECTRON LIMITED (3-1, Akasaka 5-chome, Minato-ku, Tokyo1076325), 東京エレクトロン株式会社 (東京都港区赤坂五丁目３番１号) filed a patent application (PCT/JP2024/036763) for "SUBSTRATE PROCESSING DEVICE, ABNORMALITY DETECTION METHOD, AND METHOD FOR ADJUSTING SUBSTRATE PROCESSING DEVICE" on Oct 16, 2024. With publication no. WO/2025/094660, the details related to the patent application was published on May 08, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Pr...