INTERNATIONAL PATENT: THE REGENTS OF THE UNIVERSITY OF CALIFORNIA FILES APPLICATION FOR "WAFER SCALE, LOW DEFECT DENSITY, STRAIN RELAXED TEMPLATE FOR III-NITRIDE-BASED HIGH EFFICIENCY AND HIGH POWER DEVICES"

GENEVA, May 6 -- THE REGENTS OF THE UNIVERSITY OF CALIFORNIA (1111 Franklin StreetTwelfth FloorOakland, California 94607-5200) filed a patent application (PCT/US2024/053002) for "WAFER SCALE, LOW DEFECT DENSITY, STRAIN RELAXED TEMPLATE FOR III-NITRIDE-BASED HIGH EFFICIENCY AND HIGH POWER DEVICES" on Oct 25, 2024. With publication no. WO/2025/090893, the details related to the patent application was published on May 01, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): CHANG, Hsun-Ming (780 Acacia WalkApt HGoleta, California 93117), RIENZI, Vincent (447 Mills WayGoleta, California 93117), LIM, ...