INTERNATIONAL PATENT: THE HONG KONG UNIVERSITY OF SCIENCE AND TECHNOLOGY FILES APPLICATION FOR "GENERATING TEST ERROR PATTERNS (TEPS) FOR SOFT-INPUT STEP-GRAND"

GENEVA, June 2 -- THE HONG KONG UNIVERSITY OF SCIENCE AND TECHNOLOGY (Clear Water Bay, KowloonHong Kong) filed a patent application (PCT/CN2024/133294) for "GENERATING TEST ERROR PATTERNS (TEPS) FOR SOFT-INPUT STEP-GRAND" on Nov 20, 2024. With publication no. WO/2025/108328, the details related to the patent application was published on May 30, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): ABBAS, Syed Mohsin (C27, Room C, Flat E, 9/F, East South Building, 475-481 Hennessy Road, Causeway BayHong Kong), TSUI, Chi-Ying (Flat 6B, Tower 15, Senior Staff Quarter, HKUST, Clear Water Bay, Sai Kung...