INTERNATIONAL PATENT: TERADYNE, INC. FILES APPLICATION FOR "PROBE HEAD FOR LED TEST SYSTEM"

GENEVA, April 30 -- TERADYNE, INC. (600 Riverpark DriveNorth Reading, Massachusetts 01864) filed a patent application (PCT/US2024/051462) for "PROBE HEAD FOR LED TEST SYSTEM" on Oct 15, 2024. With publication no. WO/2025/085460, the details related to the patent application was published on Apr 24, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): PARRISH, Frank (245 Sycamore Grove StreetSimi Valley, California 93065), ARBUCKLE, Joesph Richard (2870 White Ridge PLApt 23Thousand Oaks, California 91362)

Abstract: An example probe head includes probe needles that are electrically conductive an...