INTERNATIONAL PATENT: TELEKI, PETER FILES APPLICATION FOR "A METHOD FOR RADIOGRAPHIC DETERMINATION OF THE THICKNESS OF OBJECTS; AND A DEVICE FOR REDUCING SCATTERED RADIATION, FOR RADIOGRAPHIC DIAGNOSTIC EXAMINATION OF OBJECTS"

GENEVA, April 28 -- TELEKI, Peter (Bocskai u. 30.H-2400 Dunaujvaros) filed a patent application (PCT/HU2024/000006) for "A METHOD FOR RADIOGRAPHIC DETERMINATION OF THE THICKNESS OF OBJECTS; AND A DEVICE FOR REDUCING SCATTERED RADIATION, FOR RADIOGRAPHIC DIAGNOSTIC EXAMINATION OF OBJECTS" on Oct 14, 2024. With publication no. WO/2025/083434, the details related to the patent application was published on Apr 24, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): TELEKI, Peter (Bocskai u. 30.H-2400 Dunaujvaros)

Abstract: The subject of the present invention concerns the non-destructive radiolog...