INTERNATIONAL PATENT: TECHNOPROBE S.P.A. FILES APPLICATION FOR "TEST SYSTEM FOR TESTING ELECTRONIC DEVICES INTEGRATED ON A SEMICONDUCTOR WAFER"

GENEVA, May 18 -- TECHNOPROBE S.P.A. (Via Cavalieri di Vittorio Veneto, 223870 Cernusco Lombardone (LC)) filed a patent application (PCT/EP2024/081352) for "TEST SYSTEM FOR TESTING ELECTRONIC DEVICES INTEGRATED ON A SEMICONDUCTOR WAFER" on Nov 06, 2024. With publication no. WO/2025/099068, the details related to the patent application was published on May 15, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): VETTORI, Riccardo (c/o TECHNOPROBE S.p.A.Via Cavalieri di Vittorio Veneto, 223870 Cernusco Lombardone (LC)), CAVENAGHI, Franco (c/o TECHNOPROBE S.p.A.Via Cavalieri di Vittorio Veneto, 2238...