GENEVA, Jan. 3 -- TECHIK INSTRUMENT (SHANGHAI) CO., LTD (Room 1038, Floor 2, Ji Building, No.555 Dongchuan Road, Minhang DistrictShanghai 201108), 上海太易检测技术股份有限公司 (中国上海市闵行区东川路555号己楼2层1038室) filed a patent application (PCT/CN2024/119009) for "X-RAY IMAGING DETECTION MODULE AND MOUNTING FIXTURE THEREFOR AND MOUNTING METHOD THEREFOR" on Sep 14, 2024. With publication no. WO/2026/000641, the details related to the patent application was published on Jan 02, 2026.
Notably, the patent application was submitted under the International Patent...