INTERNATIONAL PATENT: TAKANO CO., LTD., タカノ株式会社 FILES APPLICATION FOR "LEVEL DIFFERENCE MEASUREMENT DEVICE, IMAGE PROCESSING DEVICE, LEVEL DIFFERENCE MEASUREMENT METHOD AND PROGRAM"

GENEVA, June 10 -- TAKANO CO., LTD. (137, Miyada-mura, Kamiina-gun, Nagano3994301), タカノ株式会社 (長野県上伊那郡宮田村１３７) filed a patent application (PCT/JP2024/036676) for "LEVEL DIFFERENCE MEASUREMENT DEVICE, IMAGE PROCESSING DEVICE, LEVEL DIFFERENCE MEASUREMENT METHOD, AND PROGRAM" on Oct 15, 2024. With publication no. WO/2025/115430, the details related to the patent application was published on Jun 05, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): FURUKAWA Shoi...