INTERNATIONAL PATENT: SYSNET NORTH AMERICA, INC. FILES APPLICATION FOR "SYSTEMS AND METHODS FOR DYNAMICALLY DETERMINING ASSESSMENT RESULTS"

GENEVA, Aug. 19 -- SYSNET NORTH AMERICA, INC. (70 W. Madison Street, Suite 400Chicago, Illinois 60602) filed a patent application (PCT/US2025/011726) for "SYSTEMS AND METHODS FOR DYNAMICALLY DETERMINING ASSESSMENT RESULTS" on Jan 15, 2025. With publication no. WO/2025/170728, the details related to the patent application was published on Aug 14, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): PATTERSON, Thomas Joseph (c/o Sysnet North America, Inc.70 W. Madison Street, Suite 400Chicago, Illinois 60602), OWEN, Tyler Leslie (c/o Sysnet North America, Inc.70 W. Madison Street, Suite 400Chicago,...