INTERNATIONAL PATENT: SYNSPECTIVE INC., 株式会社ＳＹＮＳＰＥＣＴＩＶＥ FILES APPLICATION FOR "ELEVATION ANALYSIS DEVICE AND ELEVATION ANALYSIS METHOD"

GENEVA, Sept. 21 -- SYNSPECTIVE INC. (3-10-3, Miyoshi Koto-ku, Tokyo1350022), 株式会社Ｓｙｎｓｐｅｃｔｉｖｅ (東京都江東区三好３－１０－３) filed a patent application (PCT/JP2024/009808) for "ELEVATION ANALYSIS DEVICE AND ELEVATION ANALYSIS METHOD" on Mar 13, 2024. With publication no. WO/2025/191739, the details related to the patent application was published on Sep 18, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): MO...