INTERNATIONAL PATENT: STMICROELECTRONICS INTERNATIONAL N.V. FILES APPLICATION FOR "SCREEN SURFACE ANOMALY DETECTION"

GENEVA, March 16 -- STMICROELECTRONICS INTERNATIONAL N.V. (39, chemin du Champ-des-Filles1228 Plan-les-Ouates) filed a patent application (PCT/CN2023/117574) for "SCREEN SURFACE ANOMALY DETECTION" on Sep 07, 2023. With publication no. WO/2025/050366, the details related to the patent application was published on Mar 13, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): YU, Yiwei (TCL R & D Tower, No. 6, NanshanShenzhen, Guangdong 518227)

Abstract: A method of detecting screen surface anomaly includes training a neural network model for detecting screen surface anomaly based on photon sensin...