INTERNATIONAL PATENT: STMICROELECTRONICS (SHENZHEN) R&D CO., LTD. FILES APPLICATION FOR "METHODS, SYSTEMS AND APPARATUSES FOR CALIBRATING INTERLEAVED POWER FACTOR CORRECTION (PFC) CIRCUITS"

GENEVA, Feb. 15 -- STMICROELECTRONICS (SHENZHEN) R&D CO., LTD. (B501-B503 &6F, Block B, TCL R&D Tower, No. 6, Southern No. 1 Road, South District, Hi-Tech Industrial Park, Yuehai, NanshanShenzhen, Guangdong 518057) filed a patent application (PCT/CN2023/112322) for "METHODS, SYSTEMS, AND APPARATUSES FOR CALIBRATING INTERLEAVED POWER FACTOR CORRECTION (PFC) CIRCUITS" on Aug 10, 2023. With publication no. WO/2025/030513, the details related to the patent application was published on Feb 13, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): COSTANZO, Dino (5-24D, Peninsula 3, Shekou, NanshanShenz...