INTERNATIONAL PATENT: STICHTING NEDERLANDSE WETENSCHAPPELIJK ONDERZOEK INSTITUTEN FILES APPLICATION FOR "METHOD FOR DETECTING AND MEASURING GUNSHOT RESIDUE"

GENEVA, July 2 -- STICHTING NEDERLANDSE WETENSCHAPPELIJK ONDERZOEK INSTITUTEN (AMOLFScience Park 1041098 XG Amsterdam) filed a patent application (PCT/EP2024/088011) for "METHOD FOR DETECTING AND MEASURING GUNSHOT RESIDUE" on Dec 20, 2024. With publication no. WO/2025/133196, the details related to the patent application was published on Jun 26, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): VAN DER WEIJDEN, Arno Maurice (Stichting Nederlandse Wetenschappelijk Onderzoek Instituten -AMOLFScience Park 1041098 XG Amsterdam), ADELBERG, Kendra (Stichting Nederlandse Wetenschappelijk Onderzoek In...