INTERNATIONAL PATENT: STICHTING NEDERLANDSE WETENSCHAPPELIJK ONDERZOEK INSTITUTEN, STICHTING VU, UNIVERSITEIT VAN AMSTERDAM, ASML NETHERLANDS BV FILES APPLICATION FOR "METHOD FOR DETERMINING AN OPTICAL PROPERTY OF A MULTI-LAYER STRUCTURE"

GENEVA, June 10 -- STICHTING NEDERLANDSE WETENSCHAPPELIJK ONDERZOEK INSTITUTEN (Winthontlaan 23526 KV Utrecht), STICHTING VU (De Boelelaan 11051081 HV Amsterdam), UNIVERSITEIT VAN AMSTERDAM (Spui 211012 WX Amsterdam), ASML NETHERLANDS BV (PO Box 3245500 AH Veldhoven) filed a patent application (PCT/EP2024/080853) for "METHOD FOR DETERMINING AN OPTICAL PROPERTY OF A MULTI-LAYER STRUCTURE" on Oct 31, 2024. With publication no. WO/2025/113927, the details related to the patent application was published on Jun 05, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): GOUDER, Matthias, Carl (Winthontla...