INTERNATIONAL PATENT: SPEC-IMAGING AB FILES APPLICATION FOR "AN ASSEMBLY FOR MEASUREMENTS OF ONE OR MORE OPTICAL PARAMETERS OF A SAMPLE MEDIUM AND A METHOD FOR MEASURING ONE OR MORE OPTICAL PARAMETERS OF A SAMPLE MEDIUM USING AN ASSEMBLY"

GENEVA, Oct. 5 -- SPEC-IMAGING AB (Scheelevagen 15 Ideon Alfa 3223 63 Lund) filed a patent application (PCT/SE2025/050267) for "AN ASSEMBLY FOR MEASUREMENTS OF ONE OR MORE OPTICAL PARAMETERS OF A SAMPLE MEDIUM AND A METHOD FOR MEASURING ONE OR MORE OPTICAL PARAMETERS OF A SAMPLE MEDIUM USING AN ASSEMBLY" on Mar 25, 2025. With publication no. WO/2025/207008, the details related to the patent application was published on Oct 02, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): TOROK, Sandra (Mittlinjen 11e222 74 Lund), CHAZE, William, Rene, Serge (Sallerupsvagen 27241 37 Eslov)

Abstract: The d...