INTERNATIONAL PATENT: SOITEC FILES APPLICATION FOR "METHOD FOR CONTROLLING THE QUALITY OF A COMPOSITE STRUCTURE COMPRISING A THIN C-SIC LAYER AND COMPOSITE STRUCTURE"

GENEVA, June 2 -- SOITEC (PARC TECHNOLOGIQUE DES FONTAINESCHEMIN DES FRANQUES38190 BERNIN) filed a patent application (PCT/EP2024/081200) for "METHOD FOR CONTROLLING THE QUALITY OF A COMPOSITE STRUCTURE COMPRISING A THIN C-SIC LAYER, AND COMPOSITE STRUCTURE" on Nov 05, 2024. With publication no. WO/2025/108696, the details related to the patent application was published on May 30, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): CELA, Enrica (C/O SOITECPARC TECHNOLOGIQUE DES FONTAINESCHEMIN DES FRANQUES38190 BERNIN), CHAPELLE, Audrey (C/O SOITECPARC TECHNOLOGIQUE DES FONTAINESCHEMIN DES FRANQ...