GENEVA, May 5 -- SIKORA AG (Bruchweide 228307 Bremen) filed a patent application (PCT/EP2024/080211) for "TERAHERTZ MEASURING DEVICE AND METHOD FOR CALIBRATING A TERAHERTZ MEASURING DEVICE" on Oct 25, 2024. With publication no. WO/2025/088108, the details related to the patent application was published on May 01, 2025.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
Inventor(s): MIESNER, Sebastian (Neu-Rautendorfer StraBe 5728879 Grasberg), SIKORA, Harald (Katrepeler Landstr. 70 A28357 Bremen)
Abstract:
The invention relates to a terahertz measuring device for measuring the wall thickness of an object, wher...