INTERNATIONAL PATENT: SIKORA AG FILES APPLICATION FOR "DEVICE AND METHOD FOR DETERMINING THE REFRACTIVE INDEX AND/OR WALL THICKNESS OF AN OBJECT"

GENEVA, March 17 -- SIKORA AG (Bruchweide 228307 Bremen) filed a patent application (PCT/EP2024/073735) for "DEVICE AND METHOD FOR DETERMINING THE REFRACTIVE INDEX AND/OR WALL THICKNESS OF AN OBJECT" on Aug 23, 2024. With publication no. WO/2025/051564, the details related to the patent application was published on Mar 13, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): SCHUH, Kolja Tobias (Holtumer StraBe 2428307 Bremen)

Abstract: The invention relates to a device for determining the refractive index and/or wall thickness of an object, preferably a planar object, comprising a first trans...