INTERNATIONAL PATENT: SIGRAY, INC. FILES APPLICATION FOR "X-RAY ANALYSIS SYSTEM WITH FOCUSED X-RAY BEAM AND NON-X-RAY MICROSCOPE"

GENEVA, July 21 -- SIGRAY, INC. (5750 Imhoff Drive, Suite IConcord, California 94520) filed a patent application (PCT/US2025/010499) for "X-RAY ANALYSIS SYSTEM WITH FOCUSED X-RAY BEAM AND NON-X-RAY MICROSCOPE" on Jan 06, 2025. With publication no. WO/2025/151383, the details related to the patent application was published on Jul 17, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): STRIPE, Benjamin, Donald (c/o Sigray, Inc.5750 Imhoff Drive, Suite IConcord, California 94520), YUN, Wenbing (c/o Sigray, Inc.5750 Imhoff Drive, Suite IConcord, California 94520), KIRZ, Janos (c/o Sigray, Inc.5750 I...