INTERNATIONAL PATENT: SIEMENS INDUSTRY SOFTWARE INC. FILES APPLICATION FOR "TEST PATTERN GENERATION FOR DIAGNOSIS"

GENEVA, Sept. 10 -- SIEMENS INDUSTRY SOFTWARE INC. (5800 Granite Parkway, Suite 600Plano, Texas 75024) filed a patent application (PCT/US2025/017511) for "TEST PATTERN GENERATION FOR DIAGNOSIS" on Feb 27, 2025. With publication no. WO/2025/184287, the details related to the patent application was published on Sep 04, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): CHENG, Wu-Tung (2911 Second Avenue, Unit 1209Seattle, Washington 98101), JANICKI, Jakub (Macieja Palacza 99/460-273 Poznan), URBAN, Szczepan (Szafranowa 36 Street63-004 Gowarzewo), SHARMA, Manish (6975 SW Wehler WayWilsonville, Ore...