INTERNATIONAL PATENT: SIEMENS INDUSTRY SOFTWARE INC. FILES APPLICATION FOR "LAYOUT-BASED SYSTEMATIC DEFECT DETERMINATIONS THROUGH DESIGN UNIQUENESS AND REPEATER OVERLAP"

GENEVA, April 16 -- SIEMENS INDUSTRY SOFTWARE INC. (5800 Granite Parkway, Suite 600Plano, Texas 75024) filed a patent application (PCT/US2023/076199) for "LAYOUT-BASED SYSTEMATIC DEFECT DETERMINATIONS THROUGH DESIGN UNIQUENESS AND REPEATER OVERLAP" on Oct 06, 2023. With publication no. WO/2025/075648, the details related to the patent application was published on Apr 10, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): VEDA, Gaurav (2910 NW Parkhurst TerPortland, Oregon 97229), SHARMA, Manish (11700 SW GrenobleWilsonville, Oregon 97070), KLINGENBERG, Robert R. (15585 SW Burntwood CourtBeavert...