INTERNATIONAL PATENT: SIEMENS HEALTHCARE DIAGNOSTICS INC. FILES APPLICATION FOR "SYSTEMS AND METHODS FOR DETECTING AND CLASSIFYING PRE-ANALYTICAL ERRORS IN CLINICAL LABORATORY DIAGNOSTICS"

GENEVA, March 10 -- SIEMENS HEALTHCARE DIAGNOSTICS INC. (511 Benedict AvenueTarrytown, New York 10591) filed a patent application (PCT/US2024/040126) for "SYSTEMS AND METHODS FOR DETECTING AND CLASSIFYING PRE-ANALYTICAL ERRORS IN CLINICAL LABORATORY DIAGNOSTICS" on Jul 30, 2024. With publication no. WO/2025/049026, the details related to the patent application was published on Mar 06, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): DUDYKEVYCH, Taras (11120 Windgate CourtTega Cay, South Carolina 29708), SAVINA, Joshua (4 Bridle Brook LaneNewark, Delaware 19711), WOOD, David (9093 Quail Creek ...