INTERNATIONAL PATENT: SIEMENS HEALTHCARE DIAGNOSTICS INC. FILES APPLICATION FOR "SAMPLE QUALITY CHECK METHODS AND APPARATUS"

GENEVA, Aug. 12 -- SIEMENS HEALTHCARE DIAGNOSTICS INC. (511 Benedict AvenueTarrytown, New York 10591) filed a patent application (PCT/US2025/012839) for "SAMPLE QUALITY CHECK METHODS AND APPARATUS" on Jan 24, 2025. With publication no. WO/2025/165654, the details related to the patent application was published on Aug 07, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): SARKAR, Sulagna (732 South Millvale Avenue, Apt 6APittsburgh, Pennsylvania 15213), CHANG, Yao-Jen (256 Shadybrook LanePrinceton, New Jersey 08540), KAPOOR, Ankur (70 Ashford DrivePlainsboro, New Jersey 08536)

Abstract: In so...