INTERNATIONAL PATENT: SIEMENS HEALTHCARE DIAGNOSTICS INC. FILES APPLICATION FOR "METHODS AND KITS FOR DETECTING RADIOTHERAPY-ASSOCIATED NEURONAL DAMAGE"

GENEVA, Nov. 11 -- SIEMENS HEALTHCARE DIAGNOSTICS INC. (511 Benedict Ave.Tarrytown, New York 10591) filed a patent application (PCT/US2025/026896) for "METHODS AND KITS FOR DETECTING RADIOTHERAPY-ASSOCIATED NEURONAL DAMAGE" on Apr 29, 2025. With publication no. WO/2025/231034, the details related to the patent application was published on Nov 06, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): LEE, Stephen (3100 Hansen WayPalo Alto, CA 94304-1038), PFISTER, Sophia (3100 Hansen WayPalo Alto, CA 94304), UZGIRIS, Arejas James (3100 Hansen WayPalo Alto, CA 94304), VILALTA, Marta (3100 Hansen Way...