GENEVA, May 14 -- SIEMENS HEALTHCARE DIAGNOSTICS INC. (511 Benedict Ave.Tarrytown, New York 10591) filed a patent application (PCT/US2024/053642) for "MEASUREMENT OF MULTIPLE ANALYTES USING ACRIDINIUM LABELS" on Oct 30, 2024. With publication no. WO/2025/096599, the details related to the patent application was published on May 08, 2025.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
Inventor(s): JIANG, Qingping (65 Endean DriveEast Walpole, Massachusetts 02032), VITZTHUM, Frank (Mushecke 1935216 Biedenkopf), BEDZYK, William (310 Main St.Odessa, Delaware 19730)
Abstract:
Methods of detecting one or more an...