GENEVA, Aug. 12 -- SIEMENS HEALTHCARE DIAGNOSTICS INC. (511 Benedict AvenueTarrytown, New York 10591) filed a patent application (PCT/US2025/012279) for "DEPTH-ASSISTED SAMPLE CONTAINER CHARACTERIZATION" on Jan 20, 2025. With publication no. WO/2025/165595, the details related to the patent application was published on Aug 07, 2025.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
Inventor(s): CHANG, Yao-Jen (256 Shadybrook LanePrinceton, New Jersey 08540), PANDEY, Abhineet Kumar (422 Sand Creek Road, Apt 313Albany, New York 12205), SHENOY, Nikhil (1 Country Squire LaneWest Windsor, New Jersey 08550), DA SILVA ...