INTERNATIONAL PATENT: SI-WARE SYSTEMS FILES APPLICATION FOR "OPTICAL SPECTROSCOPY WITH CONTROLLED PATH LENGTH FOR NON-INVASIVE MEASUREMENT THROUGH SKIN"

GENEVA, Nov. 25 -- SI-WARE SYSTEMS (101 Jefferson Drive, 1st FloorMenlo Park, California 94025) filed a patent application (PCT/US2025/013744) for "OPTICAL SPECTROSCOPY WITH CONTROLLED PATH LENGTH FOR NON-INVASIVE MEASUREMENT THROUGH SKIN" on Jan 30, 2025. With publication no. WO/2025/239950, the details related to the patent application was published on Nov 20, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): OTHMAN, Ahmed M. (3 Khaled Ibn EI-Walid StSheraton Area, HeliopolisCairo, 11361), MORTADA, Bassem (3 Khaled Ibn EI-Walid StSheraton Area, HeliopolisCairo, 11361), SAADANY, Bassam (7 Geh...