INTERNATIONAL PATENT: SHIMADZU CORPORATION, 株式会社島津製作所 FILES APPLICATION FOR "SCANNING PROBE MICROSCOPE AND METHOD FOR CONTROLLING SCANNING PROBE MICROSCOPE"

GENEVA, Oct. 19 -- SHIMADZU CORPORATION (1, Nishinokyo Kuwabara-cho, Nakagyo-ku, Kyoto-shi, Kyoto6048511), 株式会社島津製作所 (京都府京都市中京区西ノ京桑原町１番地) filed a patent application (PCT/JP2025/011058) for "SCANNING PROBE MICROSCOPE AND METHOD FOR CONTROLLING SCANNING PROBE MICROSCOPE" on Mar 21, 2025. With publication no. WO/2025/216036, the details related to the patent application was published on Oct 16, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property O...