INTERNATIONAL PATENT: SHIMADZU CORPORATION, 株式会社島津製作所 FILES APPLICATION FOR "SCANNING PROBE MICROSCOPE, CONTROL DEVICE, CONTROL PROGRAM AND CONTROL METHOD"

GENEVA, June 24 -- SHIMADZU CORPORATION (1, Nishinokyo Kuwabara-cho, Nakagyo-ku, Kyoto-shi, Kyoto6048511), 株式会社島津製作所 (京都府京都市中京区西ノ京桑原町１番地) filed a patent application (PCT/JP2024/039232) for "SCANNING PROBE MICROSCOPE, CONTROL DEVICE, CONTROL PROGRAM, AND CONTROL METHOD" on Nov 05, 2024. With publication no. WO/2025/126720, the details related to the patent application was published on Jun 19, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property O...